SINTERFACE

Thin Film Analysis

TFA-2

Understand the dynamics of thin liquid films.

The TFA-2 Thin Film Analyzer enables quantitative characterization of microscopic foam and emulsion films. Combining interferometric thickness measurements with direct optical observation, it provides unique insight into film drainage, stability and rupture within a dedicated research platform.

SINTERFACE TFA-2 Thin Film Analyzer

Films

Foam & emulsion

Optical

Interferometry

Pressure

Balance technique

The TFA-2 platform

Explore the science of thin liquid films.

Thin liquid films are the fundamental building blocks of foams and emulsions. Their thickness, stability and drainage behavior determine the performance of countless formulations, from consumer products to advanced materials. The TFA-2 has been developed to characterize these properties with exceptional precision.

Based on the Thin Liquid Film Pressure Balance Technique, the instrument combines interferometric thickness measurements with direct microscopic observation, allowing researchers to investigate film formation, thinning, rupture, black film formation and disjoining pressure within a single experimental platform.

Capabilities

One platform. Endless possibilities.

Discover the measurement capabilities and integrated technologies of the TFA-2.

Interferometric thin film thickness measurement

Determine thin liquid film thickness with high precision using an interferometric measurement principle for quantitative film characterization.

Investigate thin liquid films using the well-established Thin Liquid Film Pressure Balance Technique for controlled stability studies.

Observe film drainage, thinning behavior and rupture processes to evaluate the stability of microscopic foam and emulsion films.

A high-quality inverse microscope with digital imaging enables continuous visualization throughout every stage of the experiment.

Directly monitor the appearance of black spots, black films and bilayer structures during thin film evolution.

Perform reproducible thin film investigations using a temperature-controlled measurement cell for stable experimental conditions.

Performance

Precision for thin liquid film research.

The TFA-2 combines interferometric thickness measurements with controlled pressure balance experiments to investigate the stability and dynamics of microscopic liquid films.

±0.2 nm

Thickness resolution

High-resolution interferometric measurement of microscopic thin liquid films.

30–100 nm

Film thickness

Characterize stable, thinning and equilibrium liquid films over a broad thickness range.

10–10000 Pa

Disjoining pressure

Quantify the pressure acting within thin liquid films during drainage and equilibrium.

10–80 °C

Temperature control

Perform reproducible experiments under precisely controlled thermal conditions.

Values may depend on configuration, measurement mode and optional modules.

Measurement principle

From reflected light to thin film interactions.

The TFA-2 combines the Thin Liquid Film Pressure Balance Technique with interferometric thickness measurement. A microscopic liquid film is formed inside a specialized pressure-controlled measurement cell and observed through an inverse microscope. Monochromatic light is reflected at the upper and lower film interfaces, creating an interference signal from which the film thickness is calculated. By simultaneously controlling the capillary pressure, the instrument reveals how film thickness, drainage and stability depend on the disjoining pressure acting within the film.

Thin liquid film pressure balance and interferometric thickness measurement with the SINTERFACE TFA-2

Measurement technique

Thin Film Pressure Balance

Thickness analysis

Optical interferometry

Scientific output

Disjoining pressure curves

Optional accessories

Expand your TFA-2.

Customize the TFA-2 with dedicated measurement cells, optical components and laboratory accessories for advanced thin liquid film investigations.

Porous plate set

Measurement Accessory

Glas filter for TFA-2

Glas filter for TFA-2 of different types.

Learn more

TFA-2 Configurator

Configure your TFA-2.

Configure the TFA-2 with the appropriate measurement cells, pressure-control components and optical accessories for your thin liquid film investigations.

Measurement cells
Pressure control
Optical accessories
Configurable SINTERFACE TFA-2 Thin Film Analyzer
Glas Filter

Glas Filter

Precision Filter

Modular system

Select modules, options and accessories individually.

Applications

Designed for thin liquid film research.

The TFA-2 supports quantitative investigation of microscopic liquid films across academic research and industrial formulation development. Analyze film thickness, drainage, stability and disjoining pressure in a wide range of interfacial systems.

Thin liquid film analysis of foams

Foam Stability

Investigate foam film drainage, equilibrium thickness and rupture mechanisms to improve foam stability.

Thin film analysis of emulsions

Emulsion Stability

Study microscopic emulsion films to understand coalescence, stability and interfacial interactions.

Surfactant thin film studies

Surfactant Research

Characterize surfactant-stabilized liquid films and investigate adsorption effects on film stability.

Food emulsion research

Food Science

Optimize foam and emulsion systems used in dairy products, beverages and food formulations.

Cosmetic emulsion stability

Cosmetics

Investigate the stability of creams, lotions and cosmetic emulsions through quantitative thin film analysis.

Fundamental thin liquid film research

Fundamental Interface Science

Investigate disjoining pressure, black film formation and intermolecular interactions in thin liquid films.

Scientific publications

Thousands

Publications and scientific references related to interface characterization.

Supporting thin liquid film research.

Explore peer-reviewed publications covering foam films, emulsion stability, thin liquid films, disjoining pressure, surfactant systems and interfacial phenomena investigated with SINTERFACE instruments.

Verified SINTERFACE instrument use will be clearly distinguished from recommended scientific literature.

Technical information

Everything you need for thin film characterization.

Explore the complete measurement capabilities, hardware configuration and technical specifications of the TFA-2 Thin Film Analyzer.

Thin Liquid Film Pressure Balance Technique

Interferometric film thickness measurement

Thin liquid film stability

Film drainage studies

Black spot formation

Black film formation

Disjoining pressure measurements

Pressure sequence experiments

Foam films

Emulsion films

Inverse microscope

Digital camera

Monochromatic light source

Photo sensor module

Pressure-controlled measurement cell

Temperature-controlled measurement cell

Pressure control unit

Quartz optical window

Thin film analysis

Film thickness range
30–100 nm
Thickness resolution
±0.2 nm
Disjoining pressure
10–10000 Pa
Temperature range
10–80 °C

Optics

Microscope
Inverse microscope
Camera
Digital CCD camera
Illumination
Monochromatic light source

System

Pressure control
Integrated
Software
Windows compatible

Real-time film thickness evaluation

Interferometric analysis

Pressure sequence control

Live microscopic image acquisition

Film drainage evaluation

Disjoining pressure analysis

Graphical visualization of experiments

Data export for scientific evaluation

Measurement cells

Pressure control accessories

Porous plate sets

Photo sensor module

Temperature control accessories

Specifications may vary depending on configuration, software version and optional modules.

Downloads

Documentation and resources.

Access technical documentation, application notes and supporting material for the TFA-2 Thin Film Analyzer.

Additional manuals and software downloads are available through the SINTERFACE customer portal.

Visit download center

TFA-2

Ready to investigate thin liquid films?

Discuss your research objectives with our specialists and configure the TFA-2 for foam films, emulsion systems and advanced thin liquid film investigations.

Application consultationConfiguration supportGlobal technical assistance