The development of SINTERFACE has been closely connected to the evolution of experimental methods for investigating surfaces, liquid interfaces and interfacial layers.

The Scientific Origins

Where research became measurement technology.

The origins of SINTERFACE are closely linked to scientific work in surface and interface science and to the development of experimental methods for measuring interfacial phenomena.

Questions surrounding surface and interfacial tension, adsorption, dynamic interfaces, interfacial rheology and thin liquid films required measurement systems capable of resolving complex physical processes quantitatively.

This connection between scientific methodology and instrument development became a defining principle of SINTERFACE and continues to shape the company today.

Scientific questions came first. The instruments followed.

Milestones

From scientific origins to modern instrumentation.

The history of SINTERFACE reflects the continuous development of experimental methods, instrumentation and software for the quantitative characterization of surfaces and interfaces.

1998

Foundation

SINTERFACE is founded.

SINTERFACE Technologies was founded in Berlin by Dr. Alexander Makievski and Dr. Reinhard Miller, bringing scientific expertise in interface science together with the development of dedicated experimental instrumentation.

2000s

Instrumentation

Measurement platforms evolve.

Instrument platforms for profile analysis, dynamic surface tension and complementary interface measurements developed further as experimental methods became increasingly quantitative and automated.

Early generations of SINTERFACE measurement systems

SINTERFACE Archive

2010s

Expansion

Beyond conventional tensiometry.

The measurement portfolio expanded across specialized methods for interfacial rheology, interface interactions and thin liquid films while instrument control and data evaluation continued to advance.

Today

SINTERFACE Today

A specialized platform for interface science.

Today, SINTERFACE develops instrumentation spanning profile analysis tensiometry, maximum bubble pressure tensiometry, interfacial rheology and thin-film analysis for research and industrial laboratories.

Evolution of Measurement

Evolving instrumentation.
Consistent scientific principles.

From the first PAT systems to the current PAT-1M, SINTERFACE profile analysis instrumentation has continuously evolved in design, imaging, automation and experimental control.

Early Generation

Profile Analysis

PAT 1 (Early Generation)

An early generation of SINTERFACE profile analysis instrumentation developed for quantitative drop and bubble characterization.

Development

Next Generation

PAT-1 (Development)

The PAT-1 represented the next stage in the development of SINTERFACE profile analysis systems, with increasingly integrated experimental control and image-based analysis.

Current Generation

Current Platform

PAT-1M

The current generation combines automated experimentation, high-resolution imaging and modular measurement capabilities within an integrated profile analysis platform.

One scientific foundation

Instruments evolve. The fundamental need for precise, quantitative interface characterization remains.

Scientific Collaboration

Developed in dialogue with interface science.

Scientific collaboration has played an important role in the development of SINTERFACE measurement technology.

The close connection between experimental research, theoretical understanding and instrument development has helped translate scientific questions into practical measurement methods for surfaces and liquid interfaces.

Interface Science

Scientific understanding as a foundation for measurement technology.

Research & Development

Measurement methods advance when scientific understanding and instrumentation develop together.

This principle continues to shape the development of SINTERFACE systems across tensiometry, interfacial rheology and thin-film analysis.

SINTERFACE Today

Building the next generation of interface instrumentation.

Today, SINTERFACE continues to develop measurement technology around the scientific requirements of modern interface research.

New instrument concepts combine advanced imaging, automation, modular measurement capabilities and digital workflows while remaining rooted in established methods of surface and interfacial characterization.

Next Platform

PAT-X

Future Instrumentation

A new generation of integrated measurement technology.

Looking Forward

Continuing to develop measurement technology for the interfaces of tomorrow.

The scientific questions continue to evolve — and so do the methods and instruments used to investigate them. SINTERFACE continues this development by combining interface science, precision engineering and new measurement concepts.

Company

About SINTERFACE

Learn more about the company, its scientific foundation and approach to instrumentation.

Technology

Explore our instruments

Discover the current generation of SINTERFACE measurement systems.

Contact

Talk to SINTERFACE

Get in touch about measurement technology, applications or scientific requirements.

Application Laboratory

Scientific Consultation

Technical Support & Service

Downloads & Documentation

Not sure whether your sample can be measured?

A history shaped byinterface science.